Thesis
Title A statistical study of time dependent reliability degradation of nanoscale MOSFET devices / Razaidi Hussin.
Author Hussin, Razaidi, author.
Production [Glasgow] : University of Glasgow, 2016.


Status Loan Type Location Shelf-mark
 Reference Only  Not for loan  Library Research Annexe  Thesis TA4247  

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Description xvii, 148 pages : illustrations (chiefly colour), graphs ; 30 cm
Note Ph.D. thesis submitted to the School of Engineering, College of Science and Engineering, University of Glasgow, November 2016.
Thesis Ph.D. University of Glasgow 2016 School of Engineering.
Bibliography Includes bibliographical references (pages 135-148).
Note Electronic version also available via Enlighten : Theses http://theses.gla.ac.uk/8052/
Library Class Thesis TA4247
Subject Metal oxide semiconductor field-effect transistors -- Reliability -- Theses PhD.
Metal oxide semiconductor field-effect transistors -- Computer-aided design -- Theses PhD.
Reliability (Engineering) -- Statistical methods -- Theses PhD.
Other Author University of Glasgow, degree granting institution.

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