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Theses (University of Glasgow)
Title
A statistical study of time dependent reliability degradation of nanoscale MOSFET devices / Razaidi Hussin.
Author
Hussin, Razaidi, author.
Production
[Glasgow] : University of Glasgow, 2016.
Status
Loan Type
Location
Shelf-mark
Reference Only
Not for loan
Library Research Annexe
Thesis TA4247
More Details
Description
xvii, 148 pages : illustrations (chiefly colour), graphs ; 30 cm
Note
Ph.D. thesis submitted to the School of Engineering, College of Science and Engineering, University of Glasgow, November 2016.
Thesis
Ph.D. University of Glasgow 2016 School of Engineering.
Bibliography
Includes bibliographical references (pages 135-148).
Note
Electronic version also available via Enlighten : Theses http://theses.gla.ac.uk/8052/
Library Class
Thesis TA4247
Subject
Metal oxide semiconductor field-effect transistors -- Reliability -- Theses PhD.
Metal oxide semiconductor field-effect transistors -- Computer-aided design -- Theses PhD.
Reliability (Engineering) -- Statistical methods -- Theses PhD.
Other Author
University of Glasgow, degree granting institution.
Permanent link to record