| Description |
2 v. (xxx, 1380 p.) : ill. (some col.) ; 25 cm. |
| ISBN |
9783527317066 (hbk. : alk. paper) |
|
3527317066 (hbk. : alk. paper) |
| Bibliography |
Includes bibliographical references. |
| Contents |
v. 1. The past, the present, and the future of nanoscopy / Gustaav Van Tendeloo and Dirk Van Dyck -- Transmission electron microscopy / Marc De Graef -- Atomic resolution electron microscopy / Dirk Van Dyck -- Ultrahigh-resolution transmission electron microscopy at negative spherical aberration / Knut W. Urban ... [et al.] -- Z-contrast imaging / Stephen J. Pennycook ... [et al.] -- Electron holography / Hannes Lichte -- Lorentz microscopy and electron holography of magnetic materials / Rafal E. Dunin-Borkowski ... [et al.] -- Electron tomography / Paul Anthony Midgley and Sara Bals -- Statistical parameter estimation theory - a tool for quantitative electron microscopy / Sandra Van Aert -- Dynamic transmission electron microscopy / Nigel D. Browning ... [et al.] -- Transmission electron microscopy as nanolab / Frans D. Tichelaar, Marijn A. van Huis, and Henny W. Zandbergen -- Atomic-resolution environmental transmission electron microscopy / Pratibha L. Gai and Edward D. Boyes -- Speckles in images and diffraction patterns / Michael M. J. Treacy -- Coherent electron diffractive imaging / J.M. Zuo and Weijie Huang -- Sample preparation techniques for transmission electron microscopy / Vasfi Burak Özdöl, Vesna Srot, and Peter A. van Aken -- Scanning probe microscopy - history, background, and state of the art / Ralf Heiderhoff and Ludwig Josef Balk -- Scanning probe microscopy--forces and currents in the nanoscale world / Brian J. Rodriguez ... [et al.] -- Scanning beam methods / David Joy -- Fundamentals of the focused ion beam system / Nan Yao. |
|
v. 2. Low-energy electron microscopy / Ernst Bauer -- Spin-polarized low-energy electron microscopy / Ernst Bauer -- Imaging secondary ion mass spectroscopy / Katie L. Moore, Markus Schröder, and Chris R. M. Grovenor -- Soft x-ray imaging and spectromicroscopy / Adam P. Hitchcock -- Atom probe tomography : principle and applications / Frederic Danoix and François Vurpillot -- Signal and noise maximum likelihood estimation in MRI / Jan Sijbers -- 3-D surface reconstruction from stereo scanning electron microscopy images / Shafik Huq, Andreas Koschan, and Mongi Abidi -- Nanoparticles / Miguel López-Haro ... [et al.] -- Nanowires and nanotubes / Yong Ding and Zhong Lin Wang -- Carbon nanoforms / Carla Bittencourt and Gustaaf Van Tendeloo -- Metals and alloys / Dominique Schryvers -- In situ transmission electron microscopy on metals / J.Th.M. De Hosson -- Semiconductors and semiconducting devices / Hugo Bender -- Complex oxide materials / Maria Varela ... [et al.] -- Application of transmission electron microscopy in the research of inorganic photovoltaic materials / Yanfa Yan -- Polymers / Joachim Loos -- Ferroic and multiferroic materials / Ekhard Salje -- Three-dimensional imaging of biomaterials with electron tomography / Montserrat Bárcena, Roman I. Koning, and Abraham J. Koster -- Small organic molecules and higher homologs / Ute Kolb and Tatiana E. Gorelik. |
| Library Class |
Gen Sci TM8
|
| Subject |
Microscopy.
|
|
Nanotechnology.
|
| Other Author |
Tendeloo, G. Van (Gustaaf)
|
|
Van Dyck, Dirk.
|
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Pennycook, Stephen J.
|
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