Thesis
Title Simulation of charge-trapping in nano-scale MOSFETs in the presence of random-dopants-induced variability / Muhammad Faiz Bukhori.
Author Bukhori, Muhammad Faiz.
Published 2011.


Status Loan Type Location Shelf-mark
 Reference Only  Not for loan  Library Research Annexe  Thesis TA1520  

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Description xix, 164 p. : ill. ; 30 cm.
Note Ph.D. thesis submitted to the School of Engineering, College of Science and Engineering, University of Glasgow, 2011.
Thesis Thesis (Ph.D.) -- University of Glasgow, 2011.
Bibliography Includes bibliographical references.
Note Electronic version also available via Enlighten: Theses, http://theses.gla.ac.uk
Library Class Thesis TA1520
Subject Metal oxide semiconductor field-effect transistors -- Theses PhD.
Semiconductors -- Theses PhD.
Solid state electronics -- Theses PhD.

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