Thesis
Title Gate leakage variability in nano-CMOS transistors / Stanislav Markov.
Author Markov, Stanislav.
Published 2009.

Status Loan Type Location Shelf-mark
 Reference Only  Not for loan  Library Research Annexe  Thesis TA0456  
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Description xvi, 161 p. : ill. ; 30 cm.
Note Ph.D. thesis submitted to the Faculty of Engineering, Department of Electronics and Electrical Engineering, University of Glasgow, 2009.
Thesis Thesis (Ph.D.) - University of Glasgow, 2009.
Bibliography Includes bibliographical references.
Note Electronic version also available via Enlighten: Theses, http://theses.gla.ac.uk - edited version, third party copyright material removed.
Library Class Thesis TA0456
Subject Metal oxide semiconductors, Complementary -- Theses PhD.
Metal oxide semiconductor field-effect transistors -- Theses PhD.

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